Showing results: 3196 - 3210 of 5363 items found.
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780588-01 -
NI
Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The sbRIO‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three sbRIO‑9225 channels. Non-enclosed modules are designed for OEM applications.
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S930702B -
Keysight Technologies
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930705B -
Keysight Technologies
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930701B -
Keysight Technologies
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930713B -
Keysight Technologies
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930707B -
Keysight Technologies
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930700B -
Keysight Technologies
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Model 7641 -
Jinan Testing Equipment IE Corporation
These COD gages use a high-temperature capacitive sensor and do not require any cooling. They will operate up to the maximum temperature limit of most environmental chambers used in materials testing. The Model 7641 is ideal for determination of fracture mechanics parameters such as JIC, KIC, R-curve, fatigue crack growth rate (da/dN), and testing to standards such as E1820, E399, E647, etc. All units can be displaced slightly in compression for ease of installation. The COD gage is supplied with the advanced DT6229 controller. The standard output is 0-10VDC analog signal, factory calibrated with the COD gage. This system provides a number of functional enhancements, including: high speed digital output, built in calibration and tare functions, analog and digital filters, and more. The 7641 is readily interfaced with most existing test controllers, and may be directly connected to a data acquisition system or chart recorder, or directly to a PC. The 7641 may be used for strain controlled tests such as JIC.
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PHG 80 TD/PD -
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 80 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltage* Compact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
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MRC Series -
Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.
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UC8110 -
UC Instruments, Corp.
The UC8110 desktop tunable lasers offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, DWDM system and other general purpose of fiber optical test and measurement applications. It is a wavelength high accuracy, high power output, small dimension, fast startup, affordable tunable laser source system. UC INSTRUMENTS provides C band, L band, or C+L band tunable laser sources options.
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390PT -
PulseTech Products Corp.
The 390PT Battery and System Tester lets you quickly, safely and accurately test both 6-Volt and 12-Volt lead-acid flooded, AGM (flat and spiral plate) and gel cell batteries in or out of the vehicle and test 12-Volt and 24-Volt charging systems for proper operation. Combined singe load, dynamic resistance technology and algorithms display battery voltage and capacity in easy to understand results in seconds. The handy "QUICK START" instruction guide is printed on the back of the tester.
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ETL-35 -
Kharkovenergopribor Ltd.
ETL-35 is a cable test van designed for testing electrical substation equipment.Apart from cable insulation withstand testing with DC (rectified) voltage up to 60 kV and ability to measure very small leakage currents, the system can be used for testing various objects with small electrical capacitance with AC voltage of up to 100 kV and measuring dielectric dissipation factor (Tan Delta) at industrial frequency.
